University of Surrey

Test tubes in the lab Research in the ATI Dance Research

Single ion hit detection set-up for the Zagreb ion microprobe

Smith, Richard, Karlusic, M. and Jaksic, M. (2012) Single ion hit detection set-up for the Zagreb ion microprobe Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 277. pp. 140-144.

Full text not available from this repository.

Abstract

Irradiation of materials by heavy ions accelerated in MV tandem accelerators may lead to the production of latent ion tracks in many insulators and semiconductors. If irradiation is performed in a high resolution microprobe facility, ion tracks can be ordered by submicrometer positioning precision. However, full control of the ion track positioning can only be achieved by a reliable ion hit detection system that should provide a trigger signal irrespectively of the type and thickness of the material being irradiated. The most useful process that can be utilised for this purpose is emission of secondary electrons from the sample surface that follows the ion impact. The status report of the set-up presented here is based on the use of a channel electron multiplier (CEM) detector mounted on an interchangable sample holder that is inserted into the chamber in a close geometry along with the sample to be irradiated. The set-up has been tested at the Zagreb ion microprobe for different ions and energies, as well as different geometrical arrangements. For energies of heavy ions below 1 MeV/amu, results show that efficient (100%) control of ion impact can be achieved only for ions heavier than silicon. The successful use of the set-up is demonstrated by production of ordered single ion tracks in a polycarbonate film and by monitoring fluence during ion microbeam patterning of Foturan glass.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering
Authors :
NameEmailORCID
Smith, Richardr.w.smith@surrey.ac.uk
Karlusic, M.
Jaksic, M.
Date : 15 April 2012
DOI : 10.1016/j.nimb.2011.12.036
Copyright Disclaimer : Copyright © 2011 Elsevier B.V. All rights reserved.
Uncontrolled Keywords : Single ion hit detection; Channeltron; Swift heavy ion; Ion microprobe
Depositing User : James Marshall
Date Deposited : 20 Mar 2020 14:40
Last Modified : 20 Mar 2020 14:40
URI: http://epubs.surrey.ac.uk/id/eprint/854058

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year


Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800