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Simulation-Based Model of Randomly Distributed Large-Area Field Electron Emitters

Bieker, Johannes, Forbes, Richard G., Wilfert, Stefan and Schlaak, Helmut F. (2019) Simulation-Based Model of Randomly Distributed Large-Area Field Electron Emitters IEEE Journal of the Electron Devices Society, 7. pp. 997-1006.

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Abstract

With a large-area field electron emitter (LAFE), it is desirable to choose the spacings of individual emitters in such a way that the LAFE-average emission current density and total current are maximised, when the effects of electrostatic depolarization (mutual screening) are taken into account. This paper uses simulations based on a finite element method to investigate how to do this for a LAFE with randomly distributed emitters. The approach is based on finding the apex field enhancement factor and the specific emission current for an emitter, as a function of the average nearest neighbor spacing between emitters. Using electrostatic simulations based on the finite element method, the influence of neighboring emitters on a reference emitter being placed at the LAFE centre is investigated. Arrays with 25 ideal (identical) conical emitters with rounded tops are studied for different emitter densities and applied macroscopic fields. A theoretical average spacing is derived from the Poisson Point Process Theory. An optimum average spacing, and hence optimum emitter density, can be predicted for each macroscopic field.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering
Authors :
NameEmailORCID
Bieker, Johannes
Forbes, Richard G.R.Forbes@surrey.ac.uk
Wilfert, Stefan
Schlaak, Helmut F.
Date : 9 September 2019
DOI : 10.1109/JEDS.2019.2940086
Copyright Disclaimer : This work is licensed under a Creative Commons Attribution 4.0 License. For more information, see http://creativecommons.org/licenses/by/4.0/
Uncontrolled Keywords : Field electron emission; Large area field emitters; Micro-nano-integration; Modelling; Simulation; Electrostatics; Finite element analysis; Current density; Cathodes; Frequency modulation; Electron devices; Fabrication
Depositing User : Clive Harris
Date Deposited : 08 Nov 2019 15:00
Last Modified : 08 Nov 2019 15:00
URI: http://epubs.surrey.ac.uk/id/eprint/853095

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