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Pulse-height loss in the signal readout circuit of compound semiconductor detectors

Nakhostin, Mohammad and Hitomi, K (2018) Pulse-height loss in the signal readout circuit of compound semiconductor detectors Nuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 893. pp. 146-150.

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Compound semiconductor detectors such as CdTe, CdZnTe, HgI2 and TlBr are known to exhibit large variations in their charge collection times. This paper considers the effect of such variations on the measurement of induced charge pulses by using resistive feedback charge-sensitive preamplifiers. It is shown that, due to the finite decaytime constant of the preamplifiers, the capacitive decay during the signal readout leads to a variable deficit in the measurement of ballistic signals and a digital pulse processing method is employed to correct for it. The method is experimentally examined by using sampled pulses from a TlBr detector coupled to a charge-sensitive preamplifier with 150 μs of decay-time constant and 20 % improvement in the energy resolution of the detector at 662 keV is achieved. The implications of the capacitive decay on the correction of charge-trapping effect by using depth-sensing technique are also considered.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Physics
Authors :
Hitomi, K
Date : 20 March 2018
Funders : STFC
DOI : 10.1016/j.nima.2018.03.053
Copyright Disclaimer : © 2018 The Authors. Published by Elsevier B.V. under a Creative Commons license
Uncontrolled Keywords : Compound semiconductor detectors; Pulse-height loss; Ballistic deficit effect; Signal readout; Digital signal processing
Depositing User : Melanie Hughes
Date Deposited : 28 Mar 2018 11:41
Last Modified : 11 Dec 2018 11:24

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