University of Surrey

Test tubes in the lab Research in the ATI Dance Research

Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis

Korsunsky, A.M., Salvati, E., Lunt, A.G.J., Sui, Tan, Mughal, M.Z., Daniel, R., Keckes, J., Bemporad, E. and Sebastiani, M. (2018) Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis Materials & Design, 145. pp. 55-64.

[img] Text
Nanoscale Residual Stress Depth Profiling by Focused Ion Beam Milling and Eigenstrain Analysis.pdf - Accepted version Manuscript
Restricted to Repository staff only until 22 February 2019.

Download (1MB)

Abstract

Residual stresses play a crucial role in determining material properties and behaviour, in terms of structural integrity under monotonic and cyclic loading, and for functional performance, in terms of capacitance, conductivity, band gap, and other characteristics. The methods for experimental residual stress analysis at the macro- and micro-scales are well established, but residual stress evaluation at the nanoscale faces major challenges, e.g. the need for sample sectioning to prepare thin lamellae, by its very nature introducing major modifications to the quantity being evaluated.

Residual stress analysis by micro-ring core Focused Ion Beam milling directly at sample surface offers lateral resolution better than 1 μm, and encodes information about residual stress depth variation. We report a new method for residual stress depth profiling at the resolution better than 50 nm by the application of a mathematically straightforward and robust approach based on the concept of eigenstrain. The results are validated by direct comparison with measurements by nano-focus synchrotron X-ray diffraction.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences
Authors :
NameEmailORCID
Korsunsky, A.M.
Salvati, E.
Lunt, A.G.J.
Sui, Tant.sui@surrey.ac.uk
Mughal, M.Z.
Daniel, R.
Keckes, J.
Bemporad, E.
Sebastiani, M.
Date : 21 February 2018
Funders : Engineering and Physical Sciences Research Council (EPSRC)
Identification Number : 10.1016/j.matdes.2018.02.044
Copyright Disclaimer : © 2018 Elsevier Ltd. All rights reserved.
Uncontrolled Keywords : FIB-DIC ring core; Residual stress; Eigenstrain; Depth profiling; Nano resolution; XRD
Depositing User : Clive Harris
Date Deposited : 22 Mar 2018 15:09
Last Modified : 22 Mar 2018 15:46
URI: http://epubs.surrey.ac.uk/id/eprint/846065

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year


Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800