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The Lamont—Doherty Geological Observatory Isolab 54 isotope ratio mass spectrometer

England, Jonathan, Zindler, A., Reisberg, L.C., Rubenstone, J.L., Salters, V., Marcantonio, F., Bourdon, B., Brueckner, H., Turner, P.J., Weaver, S. and Read, P. (1992) The Lamont—Doherty Geological Observatory Isolab 54 isotope ratio mass spectrometer International Journal of Mass Spectrometry and Ion Processes, 121 (3). pp. 201-240.

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Abstract

The Lamont—Doherty Geological Observatory (LDGO) Isolab 54 is a double focussing isotope ratio mass spectrometer that allows the measurement of thermal ions produced on a hot filament, (thermal-ionization mass spectrometry (TIMS)), secondary ions produced by sputtering a sample using a primary ion beam, (secondary ion mass spectrometry (SIMS)), and sputtered neutrals resonantly ionized using laser radiation, (sputter-induced resonance ionization mass spectrometry (SIRIMS)). Sputtering is carried out using an Ar primary beam generated in a duoplasmatron and focussed onto the sample using a two-lens column. Resonance ionization is accomplished using a frequency-doubled dye laser pumped by an excimer laser. The Isolab's forward geometry analyzer, consisting of an electrostatic followed by a magnetic sector, allows the simultaneous collection of different isotopes of the same element. This instrument is the first to have a multicollector that contains an ion-counting system based on a microchannel plate as well as traditional Faraday cups. A second electrostatic sector after the multicollector is equipped with an ion-counting Daly detector to allow high abundance sensitivity for measurements of large dynamics range. Selectable source, collector, α and energy slits on the instrument allow analyses to be made over a range of mass resolving powers and analyzer acceptances. Recent applications of the instrument have included the analyses of U by TIMS, Hf, Th and Re by SIMS and Re and Os by SIRIMS.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering
Authors :
NameEmailORCID
England, Jonathanj.england@surrey.ac.ukUNSPECIFIED
Zindler, A.UNSPECIFIEDUNSPECIFIED
Reisberg, L.C.UNSPECIFIEDUNSPECIFIED
Rubenstone, J.L.UNSPECIFIEDUNSPECIFIED
Salters, V.UNSPECIFIEDUNSPECIFIED
Marcantonio, F.UNSPECIFIEDUNSPECIFIED
Bourdon, B.UNSPECIFIEDUNSPECIFIED
Brueckner, H.UNSPECIFIEDUNSPECIFIED
Turner, P.J.UNSPECIFIEDUNSPECIFIED
Weaver, S.UNSPECIFIEDUNSPECIFIED
Read, P.UNSPECIFIEDUNSPECIFIED
Date : 1 December 1992
Identification Number : 10.1016/0168-1176(92)80063-7
Copyright Disclaimer : © 1992 Elsevier Ltd. All rights reserved.
Uncontrolled Keywords : Thermal ion mass spectrometry; Secondary ion mass Spectrometry; Negative thermal ion mass spectrometry; Sputter-induced resonance ionization mass spectrometry
Depositing User : Clive Harris
Date Deposited : 16 Jun 2017 09:36
Last Modified : 19 Jul 2017 09:07
URI: http://epubs.surrey.ac.uk/id/eprint/841407

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