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Quantitative analysis of electrically detected Ramsey fringes in P-doped Si

Greenland, PT, Matmon, G, Villis, BJ, Bowyer, ET, Li, J, Murdin, BN, van der Meer, AFG, Redlich, B, Pidgeon, CR and Aeppli, G (2015) Quantitative analysis of electrically detected Ramsey fringes in P-doped Si PHYSICAL REVIEW B, 92 (16), ARTN 16531.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Greenland, PTUNSPECIFIEDUNSPECIFIED
Matmon, GUNSPECIFIEDUNSPECIFIED
Villis, BJUNSPECIFIEDUNSPECIFIED
Bowyer, ETUNSPECIFIEDUNSPECIFIED
Li, JUNSPECIFIEDUNSPECIFIED
Murdin, BNb.murdin@surrey.ac.ukUNSPECIFIED
van der Meer, AFGUNSPECIFIEDUNSPECIFIED
Redlich, BUNSPECIFIEDUNSPECIFIED
Pidgeon, CRUNSPECIFIEDUNSPECIFIED
Aeppli, GUNSPECIFIEDUNSPECIFIED
Date : 13 October 2015
Identification Number : https://doi.org/10.1103/PhysRevB.92.165310
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Condensed Matter, Physics, RYDBERG STATES, SILICON, GENERATION, GERMANIUM, DONORS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 13:45
Last Modified : 17 May 2017 15:12
URI: http://epubs.surrey.ac.uk/id/eprint/840257

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