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Cloning localization approach using k-means clustering and support vector machine

Alfraih, AS, Briffa, JA and Wesemeyer, S (2015) Cloning localization approach using k-means clustering and support vector machine JOURNAL OF ELECTRONIC IMAGING, 24 (4), ARTN 04301.

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Item Type: Article
Authors :
NameEmailORCID
Alfraih, ASUNSPECIFIEDUNSPECIFIED
Briffa, JAUNSPECIFIEDUNSPECIFIED
Wesemeyer, Ss.wesemeyer@surrey.ac.ukUNSPECIFIED
Date : 1 July 2015
Identification Number : https://doi.org/10.1117/1.JEI.24.4.043019
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Optics, Imaging Science & Photographic Technology, Engineering, image forensics, tamper detection, maximally stable extremal region, scale-invariant feature transform, speeded up robust feature, k-means clustering, support vector machine, COPY-MOVE FORGERY, FEATURES
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 13:44
Last Modified : 17 May 2017 15:12
URI: http://epubs.surrey.ac.uk/id/eprint/840207

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