The effect of aluminium on the post-anneal concentration of ion implanted bismuth in silica thin films
Tools
Tools
Tools
Southern-Holland, R, Halsall, MP, Crowe, IF, Yang, P and Gwilliam, RM (2015) The effect of aluminium on the post-anneal concentration of ion implanted bismuth in silica thin films NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 365. pp. 86-88.
Full text not available from this repository.| Item Type: | Article | ||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Divisions : | Surrey research (other units) | ||||||||||||||||||
| Authors : |
|
||||||||||||||||||
| Date : | 15 December 2015 | ||||||||||||||||||
| DOI : | 10.1016/j.nimb.2015.07.036 | ||||||||||||||||||
| Uncontrolled Keywords : | Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, Bismuth, Aluminium, Rutherford backscattering spectroscopy, NEAR-INFRARED LUMINESCENCE, OPTICAL AMPLIFICATION, LASER, GLASS | ||||||||||||||||||
| Related URLs : | |||||||||||||||||||
| Depositing User : | Symplectic Elements | ||||||||||||||||||
| Date Deposited : | 17 May 2017 13:41 | ||||||||||||||||||
| Last Modified : | 25 Jan 2020 00:16 | ||||||||||||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/840078 |
Actions (login required)
 |
View Item |
Downloads
Downloads per month over past year