Light emission from rare-earths in dislocation engineered silicon substrates
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Lourenco, MA, Ludurczak, W, Prins, AD, Milosavljevic, M, Gwilliam, RM and Homewood, KP (2015) Light emission from rare-earths in dislocation engineered silicon substrates JAPANESE JOURNAL OF APPLIED PHYSICS, 54 (7), ARTN 07JB0.
Full text not available from this repository.| Item Type: | Article | |||||||||||||||||||||
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| Date : | 1 July 2015 | |||||||||||||||||||||
| DOI : | 10.7567/JJAP.54.07JB01 | |||||||||||||||||||||
| Uncontrolled Keywords : | Science & Technology, Physical Sciences, Physics, Applied, Physics, THULIUM-DOPED SILICON, EMITTING DIODE, CRYSTALLINE SILICON, LUMINESCENCE PROPERTIES, OPTICAL-PROPERTIES, RAMAN LASER, MU M, PHOTOLUMINESCENCE, NANOCRYSTALS, SPECTRA | |||||||||||||||||||||
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| Depositing User : | Symplectic Elements | |||||||||||||||||||||
| Date Deposited : | 17 May 2017 13:40 | |||||||||||||||||||||
| Last Modified : | 16 Jan 2019 18:47 | |||||||||||||||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/840030 |
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