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Leakage current and self-heating in 650 nm resonant-cavity LEDs

Hild, K, Sale, TE, Hirotani, M, Mizuno, Y and Kato, T (2003) Leakage current and self-heating in 650 nm resonant-cavity LEDs Conference on Lasers and Electro-Optics Europe - Technical Digest.

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Abstract

This paper investigates the contributions of leakage current and self-heating to the temperature sensitivity. The amount of self-heating and leakage current is estimated and plotted for a constant light output with increasing temperature for both CW and pulsed operation, and the radiative current density for 650 nm emitting GaInP based resonant cavity light emitting diodes (RCLEDs) is calculated using a drift diffusion model (DDM).The model simulates the distribution of charge carriers within the structure and their recombination mechanisms. The radiative current in GaInP quantum wells is also extracted and plotted. © 2003 IEEE.

Item Type: Article
Authors :
NameEmailORCID
Hild, Kk.hild@surrey.ac.ukUNSPECIFIED
Sale, TEUNSPECIFIEDUNSPECIFIED
Hirotani, MUNSPECIFIEDUNSPECIFIED
Mizuno, YUNSPECIFIEDUNSPECIFIED
Kato, TUNSPECIFIEDUNSPECIFIED
Date : 1 December 2003
Identification Number : 10.1109/CLEOE.2003.1312244
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 13:33
Last Modified : 17 May 2017 15:11
URI: http://epubs.surrey.ac.uk/id/eprint/839635

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