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Reflectivity fitting for accurate thickness and compositional determination in RCLEDs

Sale, TE, Hild, K, Hosea, TJC, Hirotani, M and Kato, Y (2004) Reflectivity fitting for accurate thickness and compositional determination in RCLEDs In: 8th Conference on Light-Emitting Diodes, 2004-01-27 - 2004-01-28, San Jose, CA.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Sale, TEUNSPECIFIEDUNSPECIFIED
Hild, Kk.hild@surrey.ac.ukUNSPECIFIED
Hosea, TJCUNSPECIFIEDUNSPECIFIED
Hirotani, MUNSPECIFIEDUNSPECIFIED
Kato, YUNSPECIFIEDUNSPECIFIED
Date : 1 January 2004
Identification Number : 10.1117/12.529654
Contributors :
ContributionNameEmailORCID
UNSPECIFIEDStockman, SAUNSPECIFIEDUNSPECIFIED
UNSPECIFIEDYao, HWUNSPECIFIEDUNSPECIFIED
UNSPECIFIEDSchubert, EFUNSPECIFIEDUNSPECIFIED
publisherSPIE-INT SOC OPTICAL ENGINEERING, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Multidisciplinary, Optics, Physics, Condensed Matter, Materials Science, Physics, RCLED, VCSEL, reflectivity, least squares fitting, CAVITY
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 13:33
Last Modified : 17 May 2017 15:11
URI: http://epubs.surrey.ac.uk/id/eprint/839633

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