University of Surrey

Test tubes in the lab Research in the ATI Dance Research

Modeling and experimental characterization of stepped and v-shaped {311} defects in silicon

Marques, LA, Aboy, M, Dudeck, KJ, Botton, GA, Knights, AP and Gwilliam, RM (2014) Modeling and experimental characterization of stepped and v-shaped {311} defects in silicon JOURNAL OF APPLIED PHYSICS, 115 (14), ARTN 14351.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Marques, LAUNSPECIFIEDUNSPECIFIED
Aboy, MUNSPECIFIEDUNSPECIFIED
Dudeck, KJUNSPECIFIEDUNSPECIFIED
Botton, GAUNSPECIFIEDUNSPECIFIED
Knights, APUNSPECIFIEDUNSPECIFIED
Gwilliam, RMr.gwilliam@surrey.ac.ukUNSPECIFIED
Date : 14 April 2014
Identification Number : 10.1063/1.4871538
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, SELF-INTERSTITIAL CLUSTERS, CRYSTALLINE SILICON, MOLECULAR-DYNAMICS, TIGHT-BINDING, POINT-DEFECTS, SI, DIFFUSION, GE
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 13:15
Last Modified : 17 May 2017 15:09
URI: http://epubs.surrey.ac.uk/id/eprint/838496

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year


Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800