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Investigation of slice thickness and shape milled by a focused ion beam for three-dimensional reconstruction of microstructures

Jones, HG, Mingard, KP and Cox, DC (2014) Investigation of slice thickness and shape milled by a focused ion beam for three-dimensional reconstruction of microstructures ULTRAMICROSCOPY, 139. pp. 20-28.

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Item Type: Article
Authors :
NameEmailORCID
Jones, HGUNSPECIFIEDUNSPECIFIED
Mingard, KPUNSPECIFIEDUNSPECIFIED
Cox, DCd.cox@surrey.ac.ukUNSPECIFIED
Date : 1 April 2014
Identification Number : https://doi.org/10.1016/j.ultramic.2014.01.003
Uncontrolled Keywords : Science & Technology, Technology, Microscopy, MICROSCOPY, Focused ion beam, 3D reconstruction, Slice geometry, Microstructure, FIB-SEM, SPECIMEN PREPARATION, TOMOGRAPHY
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 13:12
Last Modified : 17 May 2017 15:09
URI: http://epubs.surrey.ac.uk/id/eprint/838332

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