High Energy Ion Beam Analysis
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Grime, GW (2010) High Energy Ion Beam Analysis pp. 844-853.
Full text not available from this repository.Abstract
The use of high energy ion beams (mainly of protons or alpha particles) for chemical analysis is described. The equipment necessary for achieving this is summarized. The main detection systems are proton-induced X-ray emission (PIXE), Rutherford backscattering (RBS) and nuclear reaction analysis (NRA). © 1999 Elsevier Ltd All rights reserved.
Item Type: | Article | ||||||
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Divisions : | Surrey research (other units) | ||||||
Authors : |
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Date : | 1 December 2010 | ||||||
DOI : | 10.1016/B978-0-12-374413-5.00348-1 | ||||||
Depositing User : | Symplectic Elements | ||||||
Date Deposited : | 17 May 2017 13:01 | ||||||
Last Modified : | 24 Jan 2020 23:16 | ||||||
URI: | http://epubs.surrey.ac.uk/id/eprint/837607 |
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