High Energy Ion Beam Analysis

Grime, GW (2010) High Energy Ion Beam Analysis pp. 844-853.

Full text not available from this repository.

Abstract

The use of high energy ion beams (mainly of protons or alpha particles) for chemical analysis is described. The equipment necessary for achieving this is summarized. The main detection systems are proton-induced X-ray emission (PIXE), Rutherford backscattering (RBS) and nuclear reaction analysis (NRA). © 1999 Elsevier Ltd All rights reserved.

Item Type:	Article
Authors :	Name Email ORCID Grime, GW g.grime@surrey.ac.uk
Date :	1 December 2010
DOI :	10.1016/B978-0-12-374413-5.00348-1
Depositing User :	Symplectic Elements
Date Deposited :	17 May 2017 13:01
Last Modified :	16 Jan 2019 18:39
URI:	http://epubs.surrey.ac.uk/id/eprint/837607

Actions (login required)

View Item

Downloads