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Preparation and characterization of MOCVD thin films of cadmium sulphide

Ajayi, OB, Osuntola, OK, Ojo, IA and Jeynes, C (1994) Preparation and characterization of MOCVD thin films of cadmium sulphide Thin Solid Films, 248 (1). pp. 57-62.

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Abstract

A film of stoichiometric cadmium sulphide on quartz substrate was deposited by pyrolysis from bis-(morpholinodithioato-S,S') cadmium (C10H16N2O2S4Cd) (a single source precursor). The band gap of 2.4 eV was confirmed by optical absorption measurements. The stoichiometry and thickness were determined by Rutherford backscattering, and the absence of organic remmants in the film demonstrated by IR spectroscopy. © 1994.

Item Type: Article
Authors :
NameEmailORCID
Ajayi, OBUNSPECIFIEDUNSPECIFIED
Osuntola, OKUNSPECIFIEDUNSPECIFIED
Ojo, IAUNSPECIFIEDUNSPECIFIED
Jeynes, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Date : 1 August 1994
Identification Number : https://doi.org/10.1016/0040-6090(94)90211-9
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:53
Last Modified : 17 May 2017 15:06
URI: http://epubs.surrey.ac.uk/id/eprint/837147

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