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DAMAGE EFFECTS IN SILICON AND MNOS STRUCTURES CAUSED BY BEAMS OF IONIZED AND NEUTRAL ARGON ATOMS WITH ENERGIES BELOW 5 KEV

BANGERT, U, JEYNES, C, GOODHEW, P and WILSON, IH (1984) DAMAGE EFFECTS IN SILICON AND MNOS STRUCTURES CAUSED BY BEAMS OF IONIZED AND NEUTRAL ARGON ATOMS WITH ENERGIES BELOW 5 KEV VACUUM, 34 (1-2). pp. 163-166.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
BANGERT, UUNSPECIFIEDUNSPECIFIED
JEYNES, Cc.jeynes@surrey.ac.ukUNSPECIFIED
GOODHEW, PUNSPECIFIEDUNSPECIFIED
WILSON, IHUNSPECIFIEDUNSPECIFIED
Date : 1 January 1984
Identification Number : https://doi.org/10.1016/0042-207X(84)90121-0
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Multidisciplinary, Physics, Applied, Materials Science, Physics, MATERIALS SCIENCE, MULTIDISCIPLINARY, PHYSICS, APPLIED
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:53
Last Modified : 17 May 2017 15:06
URI: http://epubs.surrey.ac.uk/id/eprint/837141

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