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LOW-ENERGY (2-5 KEV) ARGON DAMAGE IN SILICON

BANGERT, U, GOODHEW, PJ, JEYNES, C and WILSON, IH (1986) LOW-ENERGY (2-5 KEV) ARGON DAMAGE IN SILICON JOURNAL OF PHYSICS D-APPLIED PHYSICS, 19 (4). pp. 589-603.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
BANGERT, UUNSPECIFIEDUNSPECIFIED
GOODHEW, PJUNSPECIFIEDUNSPECIFIED
JEYNES, Cc.jeynes@surrey.ac.ukUNSPECIFIED
WILSON, IHUNSPECIFIEDUNSPECIFIED
Date : 1 April 1986
Identification Number : https://doi.org/10.1088/0022-3727/19/4/013
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:53
Last Modified : 17 May 2017 15:06
URI: http://epubs.surrey.ac.uk/id/eprint/837136

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