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HIGH-ACCURACY DATA FROM RUTHERFORD BACKSCATTERING SPECTRA - MEASUREMENTS OF THE RANGE AND STRAGGLING OF 60-400 KEV AS IMPLANTS INTO SI

JEYNES, C and KIMBER, AC (1985) HIGH-ACCURACY DATA FROM RUTHERFORD BACKSCATTERING SPECTRA - MEASUREMENTS OF THE RANGE AND STRAGGLING OF 60-400 KEV AS IMPLANTS INTO SI JOURNAL OF PHYSICS D-APPLIED PHYSICS, 18 (8). L93-L97.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
JEYNES, Cc.jeynes@surrey.ac.ukUNSPECIFIED
KIMBER, ACUNSPECIFIEDUNSPECIFIED
Date : 1 January 1985
Identification Number : https://doi.org/10.1088/0022-3727/18/8/001
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:53
Last Modified : 17 May 2017 15:06
URI: http://epubs.surrey.ac.uk/id/eprint/837130

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