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AN APPLICATION OF THE TRUNCATED 2-PIECE NORMAL-DISTRIBUTION TO THE MEASUREMENT OF DEPTHS OF ARSENIC IMPLANTS IN SILICON

KIMBER, AC and JEYNES, C (1987) AN APPLICATION OF THE TRUNCATED 2-PIECE NORMAL-DISTRIBUTION TO THE MEASUREMENT OF DEPTHS OF ARSENIC IMPLANTS IN SILICON JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES C-APPLIED STATISTICS, 36 (3). pp. 352-357.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
KIMBER, ACUNSPECIFIEDUNSPECIFIED
JEYNES, Cc.jeynes@surrey.ac.ukUNSPECIFIED
Date : 1 January 1987
Uncontrolled Keywords : Science & Technology, Physical Sciences, Statistics & Probability, Mathematics, STATISTICS & PROBABILITY
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:53
Last Modified : 17 May 2017 15:06
URI: http://epubs.surrey.ac.uk/id/eprint/837128

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