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CHARACTERIZATION OF RAPID ELECTRON-BEAM ANNEALED THIN TITANIUM SILICIDE FILMS

RAMAN, VK, MAHMOOD, F, MCMAHON, RA, AHMED, H, JEYNES, C, HUTT, KW, COOPER, N and GODFREY, DJ (1988) CHARACTERIZATION OF RAPID ELECTRON-BEAM ANNEALED THIN TITANIUM SILICIDE FILMS JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 135 (3). C125-C125.

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Item Type: Article
Authors :
NameEmailORCID
RAMAN, VKUNSPECIFIEDUNSPECIFIED
MAHMOOD, FUNSPECIFIEDUNSPECIFIED
MCMAHON, RAUNSPECIFIEDUNSPECIFIED
AHMED, HUNSPECIFIEDUNSPECIFIED
JEYNES, Cc.jeynes@surrey.ac.ukUNSPECIFIED
HUTT, KWUNSPECIFIEDUNSPECIFIED
COOPER, NUNSPECIFIEDUNSPECIFIED
GODFREY, DJUNSPECIFIEDUNSPECIFIED
Date : 1 March 1988
Uncontrolled Keywords : Science & Technology, Physical Sciences, Technology, Electrochemistry, Materials Science, Coatings & Films, Materials Science, ELECTROCHEMISTRY, MATERIALS SCIENCE, COATINGS & FILMS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:53
Last Modified : 17 May 2017 15:06
URI: http://epubs.surrey.ac.uk/id/eprint/837127

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