University of Surrey

Test tubes in the lab Research in the ATI Dance Research

Scattering loss estimation using 2-d fourier analysis and modeling of sidewall roughness on optical waveguides

Jaberansary, E, Masaud, TMB, Milosevic, MM, Nedeljkovic, M, Mashanovich, GZ and Chong, HMH (2013) Scattering loss estimation using 2-d fourier analysis and modeling of sidewall roughness on optical waveguides IEEE Photonics Journal, 5 (3).

Full text not available from this repository.

Abstract

We report an accurate scattering loss 3-D modeling technique of sidewall roughness of optical SOI waveguides based on Fourier and finite-difference time domain (FDTD) analysis methods. The Fourier analysis method is based on the image recovery technique used in magnetic resonant imaging. Losses for waveguides with isotropic and anisotropic roughness are calculated for wavelengths ranging from 1550 to 3800 nm and compared with reported results in literature. Our simulations show excellent agreement with published experimental results and provide an accurate prediction of roughness-induced loss of 3-D arbitrary shaped optical waveguides. © 2009-2012 IEEE.

Item Type: Article
Authors :
NameEmailORCID
Jaberansary, EUNSPECIFIEDUNSPECIFIED
Masaud, TMBUNSPECIFIEDUNSPECIFIED
Milosevic, MMmilan.milosevic@surrey.ac.ukUNSPECIFIED
Nedeljkovic, MUNSPECIFIEDUNSPECIFIED
Mashanovich, GZUNSPECIFIEDUNSPECIFIED
Chong, HMHUNSPECIFIEDUNSPECIFIED
Date : 23 May 2013
Identification Number : https://doi.org/10.1109/JPHOT.2013.2251869
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:50
Last Modified : 17 May 2017 15:06
URI: http://epubs.surrey.ac.uk/id/eprint/836961

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year


Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800