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Simulation of the delamination of thin films

Scarle, S, Ewels, CP and Heggie, MI (2005) Simulation of the delamination of thin films European Physical Journal B, 46 (4). pp. 529-534.

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Abstract

We simulate thin film delamination using a lattice springs model. We use this model to construct a phase diagram of different delamination behaviours, produced by varying the compression of the film and also the radius to which local relaxation is allowed to take place about failing bonds. From this we see a progression from laminar and linear behaviours to radial and rounded features as compressive stress is increased. Sinusoidal telephone cord behaviour occurs only at a small range of fairly low stresses, and thin films. © EDP Sciences, Società Italiana di Fisica, Springer-Verlag 2005.

Item Type: Article
Authors :
NameEmailORCID
Scarle, SUNSPECIFIEDUNSPECIFIED
Ewels, CPUNSPECIFIEDUNSPECIFIED
Heggie, MIm.heggie@surrey.ac.ukUNSPECIFIED
Date : 1 August 2005
Identification Number : 10.1140/epjb/e2005-00285-1
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:42
Last Modified : 17 May 2017 12:42
URI: http://epubs.surrey.ac.uk/id/eprint/836425

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