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Investigation of the thermal charge "trapping-detrapping" in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra

Ishii, M, Crowe, IF, Halsall, MP, Knights, AP, Gwilliam, RM and Hamilton, B (2012) Investigation of the thermal charge "trapping-detrapping" in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra APPLIED PHYSICS LETTERS, 101 (24), ARTN 24210.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Ishii, MUNSPECIFIEDUNSPECIFIED
Crowe, IFUNSPECIFIEDUNSPECIFIED
Halsall, MPUNSPECIFIEDUNSPECIFIED
Knights, APUNSPECIFIEDUNSPECIFIED
Gwilliam, RMr.gwilliam@surrey.ac.ukUNSPECIFIED
Hamilton, BUNSPECIFIEDUNSPECIFIED
Date : 10 December 2012
Identification Number : 10.1063/1.4772475
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, SI NANOCRYSTALS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:40
Last Modified : 17 May 2017 15:05
URI: http://epubs.surrey.ac.uk/id/eprint/836297

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