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CHARACTERISTICS OF RARE-EARTH ELEMENT ERBIUM IMPLANTED IN SILICON

TANG, YS, HEASMAN, KC, GILLIN, WP and SEALY, BJ (1989) CHARACTERISTICS OF RARE-EARTH ELEMENT ERBIUM IMPLANTED IN SILICON APPLIED PHYSICS LETTERS, 55 (5). pp. 432-433.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
TANG, YSUNSPECIFIEDUNSPECIFIED
HEASMAN, KCk.heasman@surrey.ac.ukUNSPECIFIED
GILLIN, WPUNSPECIFIEDUNSPECIFIED
SEALY, BJUNSPECIFIEDUNSPECIFIED
Date : 31 July 1989
Identification Number : https://doi.org/10.1063/1.101888
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:36
Last Modified : 17 May 2017 15:04
URI: http://epubs.surrey.ac.uk/id/eprint/836036

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