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Physical dissipation mechanisms in non-contact atomic force microscopy

Trevethan, T and Kantorovich, L (2004) Physical dissipation mechanisms in non-contact atomic force microscopy Nanotechnology, 15 (2).

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Abstract

Using realistic molecular dynamics simulations on the MgO(001) surface we show that the friction coefficient and dissipation energies due to the stochastic friction force mechanism are much smaller than observed experimentally in close agreement with previous analytical models. Therefore, the method is generalized by including a single soft vibrational mode at the surface. Using methods of non-equilibrium statistical mechanics, we derive an equation of motion for the tip interacting with the soft mode. It is shown that this method enables the simultaneous description of both stochastic friction and adhesion.

Item Type: Article
Authors :
NameEmailORCID
Trevethan, Tt.trevethan@surrey.ac.ukUNSPECIFIED
Kantorovich, LUNSPECIFIEDUNSPECIFIED
Date : 1 February 2004
Identification Number : 10.1088/0957-4484/15/2/010
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:35
Last Modified : 17 May 2017 15:04
URI: http://epubs.surrey.ac.uk/id/eprint/835955

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