Improving electron emission properties of SiC layers by introducing electrically conductive clusters using ion implantation
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Tsang, WM, Wong, SP, Lindner, JKN and Silva, SRP (2005) Improving electron emission properties of SiC layers by introducing electrically conductive clusters using ion implantation Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005, 2005. pp. 54-55.
Full text not available from this repository.Item Type: | Article | |||||||||||||||
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Divisions : | Surrey research (other units) | |||||||||||||||
Authors : |
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Date : | 1 December 2005 | |||||||||||||||
DOI : | 10.1109/IVNC.2005.1619481 | |||||||||||||||
Depositing User : | Symplectic Elements | |||||||||||||||
Date Deposited : | 17 May 2017 12:22 | |||||||||||||||
Last Modified : | 24 Jan 2020 22:08 | |||||||||||||||
URI: | http://epubs.surrey.ac.uk/id/eprint/835082 |
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