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Application of ellipsometry to polymers at interfaces and in thin films

Styrkas, D, Doran, SJ, Gilchrist, T, Keddie, JL, Lu, JR, Murphy, E, Sackin, R, Su, TJ and Tzitzinou, A (1999) Application of ellipsometry to polymers at interfaces and in thin films In: Conference on Polymer Surfaces and Interfaces III, 1997-07 - ?, DURHAM UNIV, DURHAM, ENGLAND.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Styrkas, D
Doran, SJ
Gilchrist, T
Keddie, JLj.keddie@surrey.ac.uk
Lu, JR
Murphy, E
Sackin, R
Su, TJ
Tzitzinou, A
Date : 1 January 1999
Contributors :
ContributionNameEmailORCID
Richards, RW
Peace, SK
publisherJOHN WILEY & SONS INC,
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Applied, Chemistry, Multidisciplinary, Physics, Applied, Physics, Multidisciplinary, Polymer Science, Chemistry, Physics, SELF-ASSEMBLED MONOLAYERS, ATOMIC-FORCE MICROSCOPY, SPECTROSCOPIC ELLIPSOMETRY, SURFACE-ROUGHNESS, GLASS-TRANSITION, NEUTRON REFLECTION, WATER-INTERFACE, ACRYLIC LATICES, THICKNESS, PRECISION
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:20
Last Modified : 17 May 2017 15:03
URI: http://epubs.surrey.ac.uk/id/eprint/834946

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