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IR ellipsometry of crosslinking in silicone coatings: Effect of thickness

Simpson, TRE, Keddie, JL and Parbhoo, B (2003) IR ellipsometry of crosslinking in silicone coatings: Effect of thickness In: 225th National Meeting of the American-Chemical-Society, 2003-03-23 - 2003-03-27, NEW ORLEANS, LOUISIANA.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Simpson, TREUNSPECIFIEDUNSPECIFIED
Keddie, JLj.keddie@surrey.ac.ukUNSPECIFIED
Parbhoo, BUNSPECIFIEDUNSPECIFIED
Date : 1 March 2003
Contributors :
ContributionNameEmailORCID
publisherAMER CHEMICAL SOC, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Multidisciplinary, Chemistry
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:20
Last Modified : 17 May 2017 15:03
URI: http://epubs.surrey.ac.uk/id/eprint/834931

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