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NEUTRON REFLECTOMETRY CHARACTERIZATION OF INTERFACE WIDTH BETWEEN SOL-GEL TITANIUM-DIOXIDE AND SILICON DIOXIDE THIN-FILMS

KEDDIE, JL, NORTON, LJ, KRAMER, EJ and GIANNELIS, EP (1993) NEUTRON REFLECTOMETRY CHARACTERIZATION OF INTERFACE WIDTH BETWEEN SOL-GEL TITANIUM-DIOXIDE AND SILICON DIOXIDE THIN-FILMS JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 76 (10). pp. 2534-2538.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
KEDDIE, JLj.keddie@surrey.ac.ukUNSPECIFIED
NORTON, LJUNSPECIFIEDUNSPECIFIED
KRAMER, EJUNSPECIFIEDUNSPECIFIED
GIANNELIS, EPUNSPECIFIEDUNSPECIFIED
Date : 1 October 1993
Identification Number : https://doi.org/10.1111/j.1151-2916.1993.tb03978.x
Uncontrolled Keywords : Science & Technology, Technology, Materials Science, Ceramics, Materials Science, MATERIALS SCIENCE, CERAMICS, TIO2-SIO2 GLASSES, CRYSTALLIZATION, LAYER
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:20
Last Modified : 17 May 2017 15:03
URI: http://epubs.surrey.ac.uk/id/eprint/834929

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