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Use of ellipsometry and gravimetry to develop calibration standards for measuring silicone coat weight and thickness with x-ray fluorescence spectroscopy

Parbhoo, B, Izrael, S, Salamanca, JM and Keddie, JL (2000) Use of ellipsometry and gravimetry to develop calibration standards for measuring silicone coat weight and thickness with x-ray fluorescence spectroscopy SURFACE AND INTERFACE ANALYSIS, 29 (5). pp. 341-345.

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Item Type: Article
Authors :
NameEmailORCID
Parbhoo, BUNSPECIFIEDUNSPECIFIED
Izrael, SUNSPECIFIEDUNSPECIFIED
Salamanca, JMUNSPECIFIEDUNSPECIFIED
Keddie, JLj.keddie@surrey.ac.ukUNSPECIFIED
Date : 1 May 2000
Identification Number : https://doi.org/10.1002/(SICI)1096-9918(200005)29:5<341::AID-SIA874>3.0.CO;2-I
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, silicone, coatings, ellipsometry, thickness, x-ray fluorescence spectroscopy
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:20
Last Modified : 17 May 2017 15:03
URI: http://epubs.surrey.ac.uk/id/eprint/834911

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