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Structural analysis of organic interfacial layers by ellipsometry

Keddie, JL (2001) Structural analysis of organic interfacial layers by ellipsometry CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, 6 (2). pp. 102-110.

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Item Type: Article
Authors :
NameEmailORCID
Keddie, JLj.keddie@surrey.ac.ukUNSPECIFIED
Date : 1 April 2001
Identification Number : https://doi.org/10.1016/S1359-0294(01)00070-X
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, ellipsometry, adsorption, reflectivity, thin films, data inversion, surface excess, solution ambiguity, surfaces, interfaces, polymers, surfactants, critical phenomena, AIR-WATER-INTERFACE, INFRARED SPECTROSCOPIC ELLIPSOMETRY, NONIONIC SURFACTANTS, PROTEIN ADSORPTION, BETA-CASEIN, SOLID/LIQUID INTERFACE, OVERFLOWING CYLINDER, NEUTRON REFLECTION, DIBLOCK COPOLYMERS, OPTICAL TECHNIQUES
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:20
Last Modified : 17 May 2017 15:03
URI: http://epubs.surrey.ac.uk/id/eprint/834908

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