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MICROSCOPE SPECTROPHOTOMETRIC STUDY OF GAAS/ALXGA1-XAS MBE STRUCTURES

GEATCHES, RM, REESON, KJ, CRIDDLE, AJ, WEBB, RP, PEARSON, PJ and WEISS, BL (1994) MICROSCOPE SPECTROPHOTOMETRIC STUDY OF GAAS/ALXGA1-XAS MBE STRUCTURES JOURNAL OF PHYSICS D-APPLIED PHYSICS, 27 (7). pp. 1528-1532.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
GEATCHES, RMUNSPECIFIEDUNSPECIFIED
REESON, KJUNSPECIFIEDUNSPECIFIED
CRIDDLE, AJUNSPECIFIEDUNSPECIFIED
WEBB, RPr.webb@surrey.ac.ukUNSPECIFIED
PEARSON, PJUNSPECIFIEDUNSPECIFIED
WEISS, BLUNSPECIFIEDUNSPECIFIED
Date : 14 July 1994
Identification Number : https://doi.org/10.1088/0022-3727/27/7/029
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, SINGLE QUANTUM-WELLS, SPECTROSCOPIC ELLIPSOMETRY, OPTICAL-PROPERTIES, SILICON
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:18
Last Modified : 17 May 2017 15:03
URI: http://epubs.surrey.ac.uk/id/eprint/834762

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