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Energetic ion impacts on quartz surfaces: A study by atomic force microscopy

Wilson, IH, Xu, JB, Devine, RAB and Webb, RP (1996) Energetic ion impacts on quartz surfaces: A study by atomic force microscopy NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 118 (1-4). pp. 473-477.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Wilson, IHUNSPECIFIEDUNSPECIFIED
Xu, JBUNSPECIFIEDUNSPECIFIED
Devine, RABUNSPECIFIEDUNSPECIFIED
Webb, RPr.webb@surrey.ac.ukUNSPECIFIED
Date : 1 September 1996
Identification Number : https://doi.org/10.1016/0168-583X(95)01477-2
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, SCANNING TUNNELING MICROSCOPY
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:17
Last Modified : 17 May 2017 15:02
URI: http://epubs.surrey.ac.uk/id/eprint/834755

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