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APPLICATION OF TRANSMISSION ION CHANNELING TO THE IMAGING OF STACKING-FAULTS

KING, PJC, BREESE, MBH, WILSHAW, PR and GRIME, GW (1995) APPLICATION OF TRANSMISSION ION CHANNELING TO THE IMAGING OF STACKING-FAULTS In: 4th International Conference on Nuclear Microprobe Technology and Applications, 1994-10-10 - 1994-10-14, SHANGHAI INT HOUSE EDUC, SHANGHAI, PEOPLES R CHINA.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
KING, PJCUNSPECIFIEDUNSPECIFIED
BREESE, MBHUNSPECIFIEDUNSPECIFIED
WILSHAW, PRUNSPECIFIEDUNSPECIFIED
GRIME, GWg.grime@surrey.ac.ukUNSPECIFIED
Date : 1 September 1995
Identification Number : 10.1016/0168-583X(95)00449-1
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE BV, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, MICROSCOPY
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:06
Last Modified : 17 May 2017 15:01
URI: http://epubs.surrey.ac.uk/id/eprint/833980

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