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EVIDENCE FROM ION CHANNELING IMAGES FOR THE ELASTIC RELAXATION OF A SI0.85GE0.15 LAYER GROWN ON A PATTERNED SI SUBSTRATE

KING, PJC, BREESE, MBH, SMULDERS, PJM, WILKINSON, AJ, BOOKER, GR, PARKER, EHC and GRIME, GW (1995) EVIDENCE FROM ION CHANNELING IMAGES FOR THE ELASTIC RELAXATION OF A SI0.85GE0.15 LAYER GROWN ON A PATTERNED SI SUBSTRATE APPLIED PHYSICS LETTERS, 67 (24). pp. 3566-3568.

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Item Type: Article
Authors :
NameEmailORCID
KING, PJCUNSPECIFIEDUNSPECIFIED
BREESE, MBHUNSPECIFIEDUNSPECIFIED
SMULDERS, PJMUNSPECIFIEDUNSPECIFIED
WILKINSON, AJUNSPECIFIEDUNSPECIFIED
BOOKER, GRUNSPECIFIEDUNSPECIFIED
PARKER, EHCUNSPECIFIEDUNSPECIFIED
GRIME, GWg.grime@surrey.ac.ukUNSPECIFIED
Date : 11 December 1995
Identification Number : https://doi.org/10.1063/1.115319
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, TRANSMISSION
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:06
Last Modified : 17 May 2017 15:01
URI: http://epubs.surrey.ac.uk/id/eprint/833977

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