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QUANTITATIVE PIXE ANALYSIS USING A SCANNING PROTON MICROBEAM

JAKSIC, M, GRIME, GW, HENDERSON, J and WATT, F (1991) QUANTITATIVE PIXE ANALYSIS USING A SCANNING PROTON MICROBEAM NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 54 (4). pp. 491-498.

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Item Type: Article
Authors :
NameEmailORCID
JAKSIC, MUNSPECIFIEDUNSPECIFIED
GRIME, GWg.grime@surrey.ac.ukUNSPECIFIED
HENDERSON, JUNSPECIFIEDUNSPECIFIED
WATT, FUNSPECIFIEDUNSPECIFIED
Date : 1 April 1991
Identification Number : https://doi.org/10.1016/0168-583X(91)95397-V
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, X-RAY-EMISSION, SI(LI) DETECTORS, CROSS-SECTIONS, EFFICIENCY DETERMINATION, SHELL IONIZATION, K-SHELL, INTENSITIES, CALIBRATION, ROUGHNESS, ENERGIES
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:05
Last Modified : 17 May 2017 15:01
URI: http://epubs.surrey.ac.uk/id/eprint/833914

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