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MEV PROTON MICROPROBE ANALYSIS OF SILICON ON INSULATOR STRUCTURES

JAMIESON, DN, GRIME, GW, WATT, F and WILLIAMS, DA (1989) MEV PROTON MICROPROBE ANALYSIS OF SILICON ON INSULATOR STRUCTURES In: CONF ON MICROSCOPY OF SEMICONDUCTING MATERIALS, 1989-04-10 - 1989-04-13, OXFORD UNIV, OXFORD, ENGLAND.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
JAMIESON, DNUNSPECIFIEDUNSPECIFIED
GRIME, GWg.grime@surrey.ac.ukUNSPECIFIED
WATT, FUNSPECIFIEDUNSPECIFIED
WILLIAMS, DAUNSPECIFIEDUNSPECIFIED
Date : 1 January 1989
Contributors :
ContributionNameEmailORCID
UNSPECIFIEDCULLIS, AGUNSPECIFIEDUNSPECIFIED
UNSPECIFIEDHUTCHINSON, JLUNSPECIFIEDUNSPECIFIED
publisherIOP PUBLISHING LTD, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Multidisciplinary, Microscopy, Physics, Applied, Physics, Condensed Matter, Materials Science, Physics
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:05
Last Modified : 17 May 2017 15:01
URI: http://epubs.surrey.ac.uk/id/eprint/833909

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