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STUDIES OF RB ION-EXCHANGED KTIOPO4 WAVE-GUIDES BY X-RAY-DIFFRACTION, SIMS, ELECTRON AND PROTON MICROPROBE ANALYSIS AND COMPARISON WITH OPTICAL REFRACTIVE-INDEX PROFILES

DUHLEV, R, PITT, CW, THOMAS, PA, JAMES, AG and GRIME, GW (1993) STUDIES OF RB ION-EXCHANGED KTIOPO4 WAVE-GUIDES BY X-RAY-DIFFRACTION, SIMS, ELECTRON AND PROTON MICROPROBE ANALYSIS AND COMPARISON WITH OPTICAL REFRACTIVE-INDEX PROFILES In: International Symposium on Physical Concepts and Materials for Novel Optoelectronic Device Application 2, 1993-05-24 - 1993-05-27, TRIESTE, ITALY.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
DUHLEV, RUNSPECIFIEDUNSPECIFIED
PITT, CWUNSPECIFIEDUNSPECIFIED
THOMAS, PAUNSPECIFIEDUNSPECIFIED
JAMES, AGUNSPECIFIEDUNSPECIFIED
GRIME, GWg.grime@surrey.ac.ukUNSPECIFIED
Date : 1 January 1993
Identification Number : https://doi.org/10.1117/12.162741
Contributors :
ContributionNameEmailORCID
UNSPECIFIEDBeltram, FUNSPECIFIEDUNSPECIFIED
UNSPECIFIEDGornik, EUNSPECIFIEDUNSPECIFIED
publisherSPIE - INT SOC OPTICAL ENGINEERING, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Multidisciplinary, Optics, Physics, Applied, Materials Science, Physics
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:04
Last Modified : 17 May 2017 15:01
URI: http://epubs.surrey.ac.uk/id/eprint/833894

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