The identification of plaggen soils using external beam microPIXE analysis
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Grime, GW and Guttmann-Bond, E (2011) The identification of plaggen soils using external beam microPIXE analysis X-Ray Spectrometry, 40 (3). pp. 210-214.
Full text not available from this repository.Item Type: | Article | |||||||||
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Divisions : | Surrey research (other units) | |||||||||
Authors : |
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Date : | 2011 | |||||||||
DOI : | 10.1002/xrs.1330 | |||||||||
Depositing User : | Symplectic Elements | |||||||||
Date Deposited : | 17 May 2017 12:03 | |||||||||
Last Modified : | 24 Jan 2020 21:38 | |||||||||
URI: | http://epubs.surrey.ac.uk/id/eprint/833830 |
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