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Structural and compositional study of Erbium-doped silicon nanocrystals by HAADF, EELS and HRTEM techniques in an aberration corrected STEM

Kashtiban, RJ, Bangert, U, Crowe, I, Halsall, P, Sherliker, B, Harvey, J, Eccles, J, Knights, AP, Gwilliam, R and Gass, M (2010) Structural and compositional study of Erbium-doped silicon nanocrystals by HAADF, EELS and HRTEM techniques in an aberration corrected STEM Journal of Physics: Conference Series, 209.

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Item Type: Article
Authors :
NameEmailORCID
Kashtiban, RJUNSPECIFIEDUNSPECIFIED
Bangert, UUNSPECIFIEDUNSPECIFIED
Crowe, IUNSPECIFIEDUNSPECIFIED
Halsall, PUNSPECIFIEDUNSPECIFIED
Sherliker, BUNSPECIFIEDUNSPECIFIED
Harvey, JUNSPECIFIEDUNSPECIFIED
Eccles, JUNSPECIFIEDUNSPECIFIED
Knights, APUNSPECIFIEDUNSPECIFIED
Gwilliam, Rr.gwilliam@surrey.ac.ukUNSPECIFIED
Gass, MUNSPECIFIEDUNSPECIFIED
Date : 2010
Identification Number : 10.1088/1742-6596/209/1/012043
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:02
Last Modified : 17 May 2017 15:00
URI: http://epubs.surrey.ac.uk/id/eprint/833711

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