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Quantitative electrostatic force microscopy-phase measurements

Lei, CH, Das, A, Elliott, M and Macdonald, JE (2004) Quantitative electrostatic force microscopy-phase measurements NANOTECHNOLOGY, 15 (5), PII S0957-. pp. 627-634.

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Item Type: Article
Authors :
NameEmailORCID
Lei, CHc.lei@surrey.ac.ukUNSPECIFIED
Das, AUNSPECIFIEDUNSPECIFIED
Elliott, MUNSPECIFIEDUNSPECIFIED
Macdonald, JEUNSPECIFIEDUNSPECIFIED
Date : 1 May 2004
Identification Number : 10.1088/0957-4484/15/5/038
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Nanoscience & Nanotechnology, Materials Science, Multidisciplinary, Physics, Applied, Science & Technology - Other Topics, Materials Science, Physics, MATERIALS SCIENCE, MULTIDISCIPLINARY, NANOSCIENCE & NANOTECHNOLOGY, PHYSICS, APPLIED, KELVIN PROBE MICROSCOPY, CONTACT POTENTIAL DIFFERENCE, FIELD-EFFECT TRANSISTORS, RESOLUTION, SURFACE, CONDUCTIVITY, TRANSPORT, CHARGE, DNA
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:01
Last Modified : 17 May 2017 12:01
URI: http://epubs.surrey.ac.uk/id/eprint/833699

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