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High-aspect ratio needle probes for combined scanning electrochemical microscopy-Atomic force microscopy

Wain, AJ, Cox, D, Zhou, S and Turnbull, A (2011) High-aspect ratio needle probes for combined scanning electrochemical microscopy-Atomic force microscopy ELECTROCHEMISTRY COMMUNICATIONS, 13 (1). pp. 78-81.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Wain, AJUNSPECIFIEDUNSPECIFIED
Cox, Dd.cox@surrey.ac.ukUNSPECIFIED
Zhou, SUNSPECIFIEDUNSPECIFIED
Turnbull, AUNSPECIFIEDUNSPECIFIED
Date : 1 January 2011
Identification Number : https://doi.org/10.1016/j.elecom.2010.11.018
Uncontrolled Keywords : Science & Technology, Physical Sciences, Electrochemistry, ELECTROCHEMISTRY, SECM, AFM, Combined SECM-AFM, Needle probes, Nanoscale electrochemistry, AC-SECM, NANOELECTRODES, TOPOGRAPHY
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 12:00
Last Modified : 17 May 2017 15:00
URI: http://epubs.surrey.ac.uk/id/eprint/833609

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