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Probing the early stages of solvent evaporation and relaxation in solvent-cast polymer thin films by spectroscopic ellipsometry

López García, I, Keddie, JL and Sferrazza, M (2011) Probing the early stages of solvent evaporation and relaxation in solvent-cast polymer thin films by spectroscopic ellipsometry Surface and Interface Analysis, 43 (11). pp. 1448-1452.

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Abstract

The formation of solvent-cast, poly(methyl methacrylate) (PMMA) thin films from dilute bromobenzene solutions was studied using an ellipsometry technique. Bromobenzene has a relatively high refractive index (compared to PMMA), which provides contrast in ellipsometry, allowing the concentration to be determined. The solvent also has a relatively low evaporation rate, which makes the film formation slow enough to capture via the technique. The formation of the glassy film is thus studied in situ, and information on solvent and void concentration in the thin film during the film formation process is obtained. There is evidence that nanovoids (representing intramolecular space) develop in the film when solvent evaporates.

Item Type: Article
Authors :
NameEmailORCID
López García, IUNSPECIFIEDUNSPECIFIED
Keddie, JLj.keddie@surrey.ac.ukUNSPECIFIED
Sferrazza, MUNSPECIFIEDUNSPECIFIED
Date : 2011
Identification Number : 10.1002/sia.3728
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:59
Last Modified : 17 May 2017 15:00
URI: http://epubs.surrey.ac.uk/id/eprint/833538

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