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Characterization of Ni-B amorphous alloys with x-ray photoelectron and secondary ion mass spectroscopy

Diplas, S, Lehrmann, J, Jorgensen, S, Valand, T, Watts, JF and Tafto, J (2005) Characterization of Ni-B amorphous alloys with x-ray photoelectron and secondary ion mass spectroscopy SURFACE AND INTERFACE ANALYSIS, 37 (5). pp. 459-465.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Diplas, SUNSPECIFIEDUNSPECIFIED
Lehrmann, JUNSPECIFIEDUNSPECIFIED
Jorgensen, SUNSPECIFIEDUNSPECIFIED
Valand, TUNSPECIFIEDUNSPECIFIED
Watts, JFj.watts@surrey.ac.ukUNSPECIFIED
Tafto, JUNSPECIFIEDUNSPECIFIED
Date : 1 May 2005
Identification Number : https://doi.org/10.1002/sia.2033
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, XPS, SIMS, electrodeposition, Ni alloys, CHARGE-TRANSFER CALCULATIONS, HYDROGEN EVOLUTION REACTION, AUGER PARAMETER, ELECTRONIC-STRUCTURE, PD ALLOYS, CHEMICAL-STATES, TI-AL, BEHAVIOR, SPECTRA, SORPTION
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:52
Last Modified : 17 May 2017 14:59
URI: http://epubs.surrey.ac.uk/id/eprint/833074

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