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The determination of adsorption isotherms by XPS and ToF-SIMS: their role in adhesion science

Watts, JF and Castle, JE (1999) The determination of adsorption isotherms by XPS and ToF-SIMS: their role in adhesion science INTERNATIONAL JOURNAL OF ADHESION AND ADHESIVES, 19 (6). pp. 435-443.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Watts, JFj.watts@surrey.ac.ukUNSPECIFIED
Castle, JEUNSPECIFIEDUNSPECIFIED
Date : 1 January 1999
Identification Number : https://doi.org/10.1016/S0143-7496(98)00068-2
Uncontrolled Keywords : Science & Technology, Technology, Engineering, Chemical, Materials Science, Multidisciplinary, Engineering, Materials Science, ENGINEERING, CHEMICAL, MATERIALS SCIENCE, MULTIDISCIPLINARY, ToF-SIMS, X-ray photoelectron spectroscopy, adhesion by chemical bonding, interface, absorption isotherm
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:52
Last Modified : 17 May 2017 14:59
URI: http://epubs.surrey.ac.uk/id/eprint/833071

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