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Electron spectroscopy with CrK beta photons: high energy XPS and X-AES

Diplas, S, Watts, JF, Morton, SA, Beamson, G, Tsakiropoulos, P, Clark, DT and Castle, JE (2001) Electron spectroscopy with CrK beta photons: high energy XPS and X-AES JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 113 (2-3). pp. 153-166.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Diplas, SUNSPECIFIEDUNSPECIFIED
Watts, JFj.watts@surrey.ac.ukUNSPECIFIED
Morton, SAUNSPECIFIEDUNSPECIFIED
Beamson, GUNSPECIFIEDUNSPECIFIED
Tsakiropoulos, PUNSPECIFIEDUNSPECIFIED
Clark, DTUNSPECIFIEDUNSPECIFIED
Castle, JEUNSPECIFIEDUNSPECIFIED
Date : 1 February 2001
Identification Number : https://doi.org/10.1016/S0368-2048(00)00290-5
Uncontrolled Keywords : Science & Technology, Technology, Spectroscopy, SPECTROSCOPY, high energy XPS, CrK beta, electron attenuation length, Auger parameter, MEAN FREE PATHS, AUGER-PARAMETER, CHARGE-TRANSFER, KINETIC-ENERGY, CROSS-SECTIONS, METAL-ALLOYS, SENSITIVITY, RESOLUTION, RADIATION, FILMS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:52
Last Modified : 17 May 2017 14:59
URI: http://epubs.surrey.ac.uk/id/eprint/833050

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