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X-ray photoelectron spectroscopy studies of Ti-Al and Ti-Al-V alloys using CrK beta radiation

Diplas, S, Watts, JF, Tsakiropoulos, P, Shao, G, Beamson, G and Matthew, JAD (2001) X-ray photoelectron spectroscopy studies of Ti-Al and Ti-Al-V alloys using CrK beta radiation SURFACE AND INTERFACE ANALYSIS, 31 (8). pp. 734-744.

Full text not available from this repository.
Item Type: Article
Authors :
NameEmailORCID
Diplas, SUNSPECIFIEDUNSPECIFIED
Watts, JFj.watts@surrey.ac.ukUNSPECIFIED
Tsakiropoulos, PUNSPECIFIEDUNSPECIFIED
Shao, GUNSPECIFIEDUNSPECIFIED
Beamson, GUNSPECIFIEDUNSPECIFIED
Matthew, JADUNSPECIFIEDUNSPECIFIED
Date : 1 August 2001
Identification Number : https://doi.org/10.1002/sia.1103.abs
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, XPS, Ti-Al, Ti-Al-V, Auger parameter, CrK beta, AUGER-PARAMETER, CHARGE-TRANSFER, ELECTRONIC-STRUCTURE, PHASE, STATES, ALKALI
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:52
Last Modified : 17 May 2017 14:59
URI: http://epubs.surrey.ac.uk/id/eprint/833047

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