Angle-resolved XPS characterization of urea formaldehyde-epoxy systems

Perruchot, C, Watts, JF, Lowe, C, White, RG and Cumpson, PJ (2002) Angle-resolved XPS characterization of urea formaldehyde-epoxy systems SURFACE AND INTERFACE ANALYSIS, 33 (10-11). pp. 869-878.

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Item Type:	Article
Authors :	Name Email ORCID Perruchot, C UNSPECIFIED UNSPECIFIED Watts, JF j.watts@surrey.ac.uk UNSPECIFIED Lowe, C UNSPECIFIED UNSPECIFIED White, RG UNSPECIFIED UNSPECIFIED Cumpson, PJ UNSPECIFIED UNSPECIFIED
Date :	1 October 2002
Identification Number :	https://doi.org/10.1002/sia.1465
Uncontrolled Keywords :	Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, angle-resolved XPS, elemental and chemical depth profiles, epoxy and urea formaldehyde resins, flow agent additives, THIN-FILMS, DEPTH-RESOLUTION, DEPOSITION, THICKNESS, ALUMINUM, RESINS, IRON
Related URLs :	Author
Depositing User :	Symplectic Elements
Date Deposited :	17 May 2017 11:51
Last Modified :	17 May 2017 14:59
URI:	http://epubs.surrey.ac.uk/id/eprint/833029

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