Angle-resolved XPS characterization of urea formaldehyde-epoxy systems
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Perruchot, C, Watts, JF, Lowe, C, White, RG and Cumpson, PJ (2002) Angle-resolved XPS characterization of urea formaldehyde-epoxy systems SURFACE AND INTERFACE ANALYSIS, 33 (10-11). pp. 869-878.
Full text not available from this repository.| Item Type: | Article | ||||||||||||||||||
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| Divisions : | Surrey research (other units) | ||||||||||||||||||
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| Date : | 1 October 2002 | ||||||||||||||||||
| DOI : | 10.1002/sia.1465 | ||||||||||||||||||
| Uncontrolled Keywords : | Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, angle-resolved XPS, elemental and chemical depth profiles, epoxy and urea formaldehyde resins, flow agent additives, THIN-FILMS, DEPTH-RESOLUTION, DEPOSITION, THICKNESS, ALUMINUM, RESINS, IRON | ||||||||||||||||||
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| Depositing User : | Symplectic Elements | ||||||||||||||||||
| Date Deposited : | 17 May 2017 11:51 | ||||||||||||||||||
| Last Modified : | 24 Jan 2020 21:21 | ||||||||||||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/833029 |
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