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Angle-resolved XPS characterization of urea formaldehyde-epoxy systems

Perruchot, C, Watts, JF, Lowe, C, White, RG and Cumpson, PJ (2002) Angle-resolved XPS characterization of urea formaldehyde-epoxy systems SURFACE AND INTERFACE ANALYSIS, 33 (10-11). pp. 869-878.

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Item Type: Article
Divisions : Surrey research (other units)
Authors :
Perruchot, C
Lowe, C
White, RG
Cumpson, PJ
Date : 1 October 2002
DOI : 10.1002/sia.1465
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, angle-resolved XPS, elemental and chemical depth profiles, epoxy and urea formaldehyde resins, flow agent additives, THIN-FILMS, DEPTH-RESOLUTION, DEPOSITION, THICKNESS, ALUMINUM, RESINS, IRON
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:51
Last Modified : 24 Jan 2020 21:21

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