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Study of exciton-polariton modes in nanocrystalline thin films of ZnO using reflectance spectroscopy

Fryar, J, McGlynn, E, Henry, MO and Mosnier, JP (2005) Study of exciton-polariton modes in nanocrystalline thin films of ZnO using reflectance spectroscopy NANOTECHNOLOGY, 16 (11). pp. 2625-2632.

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Item Type: Article
Authors :
NameEmailORCID
Fryar, Jj.fryar@surrey.ac.ukUNSPECIFIED
McGlynn, EUNSPECIFIEDUNSPECIFIED
Henry, MOUNSPECIFIEDUNSPECIFIED
Mosnier, JPUNSPECIFIEDUNSPECIFIED
Date : 1 November 2005
Identification Number : https://doi.org/10.1088/0957-4484/11/026
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Nanoscience & Nanotechnology, Materials Science, Multidisciplinary, Physics, Applied, Science & Technology - Other Topics, Materials Science, Physics, MATERIALS SCIENCE, MULTIDISCIPLINARY, NANOSCIENCE & NANOTECHNOLOGY, PHYSICS, APPLIED, OPTICAL-PROPERTIES, POLYCRYSTALLINE ZNO, EMISSION-SPECTRUM, CRYSTALS, PHOTOLUMINESCENCE, LASERS, LAYERS, WAVES, BULK, GAN
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:50
Last Modified : 17 May 2017 11:50
URI: http://epubs.surrey.ac.uk/id/eprint/832957

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