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Surface integral determination of built-in electric fields and analysis of exciton binding energies in nitride-based quantum dots

Williams, DP, Andreev, AD, Faux, DA and O'Reilly, EP (2004) Surface integral determination of built-in electric fields and analysis of exciton binding energies in nitride-based quantum dots In: 11th International Conference on Modulated Semiconductor Structures (MSS11), 2003-07-14 - 2003-07-18, Nara, JAPAN.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
NameEmailORCID
Williams, DPUNSPECIFIEDUNSPECIFIED
Andreev, ADUNSPECIFIEDUNSPECIFIED
Faux, DAd.faux@surrey.ac.ukUNSPECIFIED
O'Reilly, EPUNSPECIFIEDUNSPECIFIED
Date : 1 March 2004
Identification Number : 10.1016/j.physe.2003.11.039
Contributors :
ContributionNameEmailORCID
publisherELSEVIER SCIENCE BV, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Physical Sciences, Nanoscience & Nanotechnology, Physics, Condensed Matter, Science & Technology - Other Topics, Physics, NANOSCIENCE & NANOTECHNOLOGY, PHYSICS, CONDENSED MATTER, quantum dots, piezoelectric potential, GaN, excitons, STRAIN DISTRIBUTIONS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:50
Last Modified : 17 May 2017 14:59
URI: http://epubs.surrey.ac.uk/id/eprint/832945

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